Experimental studies of microarcs between copper electrodes - Fig. 2 (OES 521.8 nm) | INPTDAT

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Experimental studies of microarcs between copper electrodes - Fig. 2 (OES 521.8 nm)

Related to Figure 2 of the paper: Intensities I(y) of the CuI line at 521.8 nm for each side-on position y. The intensities were measured at a distance of 300 μm from the anode for a gap distance of 3 mm and DC current of 2 A.

node972_figure2a_I_y_521p8nm.csv

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Resources

Experimental studies of microarcs between copper electrodes - Fig. 2 (OES 510.6 nm)
Experimental studies of microarcs between copper electrodes - Fig. 2 (OES 515.3 nm)
Experimental studies of microarcs between copper electrodes - Fig. 2 (OES 521.8 nm)
Experimental studies of microarcs between copper electrodes - Fig. 2 (Fit)
Experimental studies of microarcs between copper electrodes - Fig. 2 (Epsilon)
Experimental studies of microarcs between copper electrodes - Fig. 3
Experimental studies of microarcs between copper electrodes - Fig. 4
Experimental studies of microarcs between copper electrodes - Fig. 4-5 (video)
Experimental studies of microarcs between copper electrodes - Fig. 5 (intensity)
Experimental studies of microarcs between copper electrodes - Fig. 5 (voltage)
Experimental studies of microarcs between copper electrodes - Fig. 6 (measurements)
Experimental studies of microarcs between copper electrodes - Fig. 6 (model)

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Field	Value
mimetype	text/csv
filesize	451 bytes
resource type	file upload
timestamp	Aug 20, 2025

Resource filetype	csv
Resource datatype	data table
Resource range
Resource quality	published